IP Library › Assignment 042572/0405
Patent Assignment
Reel/Frame 042572/0405

Assignment of Assignor's Interest

Recorded: 2017-06-02 Pages: 2
Assignors
HATAHORI, TAKAHIDE
Executed: 2017-05-23
TAKUBO, KENJI
Executed: 2017-05-23
Assignee
SHIMADZU CORPORATION
1, NISHINOKYO-KUWABARA-CHO, NAKAGYO-KU, KYOTO-SHI, KYOTO, 604-8511, JAPAN
Covered Property (1)
Defect Detection Method and Defect Detection Apparatus
Application: 15/611,254 →
Publication: US 2017/0350690