Change of Name

Recorded: 2017-06-07 Pages: 3

Assignor

ELITETECH TECHNOLOGY CO.,LTD.

Executed: 2014-05-26

Assignee

ELITE SEMICONDUCTOR, INC.

1F., NO. 27, LANE 228, MINGXING RD., ZHUDONG TOWN, HSINCHU COUNTY, 31055, TAIWAN

Covered Property (1)

Method for Smart Defect Screen and Sample

Patent: 8,312,401 →

Application: 13/005,932 →

Publication: US 2012/0185818

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.