Patent Assignment
Reel/Frame 042931/0392
Assignment of Assignor's Interest
Recorded: 2017-07-07
Pages: 4
Assignors
SAITO, YUKI
Executed: 2017-06-12
FUKAMI, YOSHIYUKI
Executed: 2017-06-12
KIYOFUJI, HIDEHIRO
Executed: 2017-06-12
Assignee
KABUSHIKI KAISHA NIHON MICRONICS
6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI,, TOKYO, 180-8508, JAPAN
Covered Property
(1)
Probe Card with Temperature Control Function, Inspection Apparatus Using the Same, and Inspection Method