Patent Assignment
Reel/Frame 042983/0124
Assignment of Assignor's Interest
Recorded: 2017-07-12
Pages: 3
Assignor
LEE, SHENG-CHIN
Executed: 2017-07-11
Assignee
UNITED MICROELECTRONICS CORP.
NO3, LI-HSIN RD.II, HSINCHU SCIENCE PARK, HSINCHU, 30078, TAIWAN
Covered Property
(1)
Test Key and Method for Monitoring Semiconductor Wafer