Patent Assignment
Reel/Frame 043091/0702
Assignment of Assignor's Interest
Recorded: 2017-07-25
Pages: 6
Assignors
SHIM, SUNG-BO
Executed: 2017-01-18
KO, JEONGHOON
Executed: 2017-01-18
LEE, JEHYUN
Executed: 2017-01-18
JEONG, JAEHOON
Executed: 2017-01-18
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Methods of Measuring Patterns and Methods of Manufacturing Semiconductor Devices Including the Same