Patent Assignment
Reel/Frame 043192/0230
Assignment of Assignor's Interest
Recorded: 2017-08-03
Pages: 10
Assignors
KARLINSKY, LEONID
Executed: 2017-03-03
COHEN, BOAZ
Executed: 2017-02-08
KAIZERMAN, IDAN
Executed: 2017-02-02
ROSENMAN, EFRAT
Executed: 2017-02-16
BATIKOFF, AMIT
Executed: 2017-02-16
RAVID, DANIEL
Executed: 2017-02-16
ROSENWEIG, MOSHE
Executed: 2017-02-21
Assignee
APPLIED MATERIAL ISRAEL, LTD.
9 OPPENHEIMER STREET, PARK RABIN, REHOVOT, 76705, ISRAEL
Covered Property
(1)
Method of Deep Learning-Based Examination of a Semiconductor Specimen and System Thereof