Patent Assignment
Reel/Frame 043462/0984
Assignment of Assignor's Interest
Recorded: 2017-08-31
Pages: 5
Assignors
SOHN, YOUNGHOON
Executed: 2017-02-20
KIM, ILSOO
Executed: 2017-02-22
YANG, YUSIN
Executed: 2017-02-20
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Inspection Method, Inspection System, and Method of Fabricating Semiconductor Package Using the Same