Patent Assignment
Reel/Frame 043475/0860
Assignment of Assignor's Interest
Recorded: 2017-09-03
Pages: 6
Assignors
SHOR, JOSEPH
Executed: 2017-02-26
WEIZMAN, YOAV
Executed: 2017-02-26
SCHIFMANN, YITZHAK
Executed: 2017-08-09
Assignee
BAR-ILAN UNIVERSITY
CAMPUS, RAMAT GAN, 5290002, ISRAEL
Covered Property
(1)
Detecting Unreliable Bits in Transistor Circuitry
Application:
15/694,809 →
Publication:
US 2019/0074984