Patent Assignment
Reel/Frame 043616/0575
Assignment of Assignor's Interest
Recorded: 2017-09-18
Pages: 5
Assignors
WU, QIANG
Executed: 2017-09-04
XIONG, WEI
Executed: 2017-09-04
LI, XUAN
Executed: 2017-09-04
Assignees
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
18 ZHANG JIANG ROAD, PUDONG NEW AREA, SHANGHAI, 201203, CHINA
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
18 WEN CHANG ROAD, ECONOMICAL-TECHNOLOGICAL DEVELOPMENT AREA, DAXING DISTRICT, BEIJING, 100176, CHINA
Covered Property
(1)
Defect Inspection Method and Apparatus Using Micro Lens Matrix