IP Library › Assignment 044184/0027
Patent Assignment
Reel/Frame 044184/0027

Confirmatory Assignment

Recorded: 2017-10-11 Pages: 14
Assignors
DE VRIES, DIRK KENNETH
Executed: 2017-10-11
VAN DE GOOR, ALBERT
Executed: 2017-10-11
Assignee
NXP B.V.
HIGH TECH CAMPUS 60, EINDHOVEN, 5656 AG, NETHERLANDS
Covered Property (1)
Analogue Measurement of Alignment Between Layers of a Semiconductor Device
Patent: 7,688,083 →
Application: 11/575,863 →
Publication: US 2009/0009196
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 17, 2007
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 019719/0843 →
Assignment of Assignor's Interest Oct 19, 2011
From: DE VRIES, DIRK KENNETH; VAN DE GOOR, ALBERT
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 027084/0635 →
Change of Name Sep 22, 2017
From: PHILIPS SEMICONDUCTORS INTERNATIONAL B.V.
To: NXP B.V.
Reel/Frame 043951/0436 →
Assignment of Assignor's Interest Sep 22, 2017
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: PHILIPS SEMICONDUCTORS INTERNATIONAL B.V.
Reel/Frame 043955/0001 →