IP Library Assignment 044421/0226
Patent Assignment
Reel/Frame 044421/0226

Assignment of Assignor's Interest

Recorded: 2017-12-18 Pages: 8
Assignors
BHATTACHARYYA, SANTOSH
Executed: 2017-12-16
DANEN, ROBERT M.
Executed: 2017-12-14
HUA, BO
Executed: 2017-12-15
MAHER, CHRISTOPHER
Executed: 2017-12-12
MEASOR, PHILIP
Executed: 2017-11-30
SHARMA, DEVASHISH
Executed: 2017-12-12
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Defect Discovery And Recipe Optimization For Inspection Of Three-Dimensional Semiconductor Structures
Application: 15/826,019 →
Publication: US 2018/0149603