Patent Assignment
Reel/Frame 044492/0831
Assignment of Assignor's Interest
Recorded: 2017-12-27
Pages: 12
Assignors
KANG, HYO HYEONG
Executed: 2017-07-05
KO, KANG WOONG
Executed: 2017-07-06
RYU, SUNG YOON
Executed: 2017-12-08
SONG, GIL WOO
Executed: 2017-12-12
AHN, JAE HYUNG
Executed: 2017-12-08
YOO, CHUL HYUNG
Executed: 2017-07-06
LEE, KYOUNG HWAN
Executed: 2017-07-26
JANG, SUNG HO
Executed: 2017-07-06
JEON, YONG JU
Executed: 2017-07-06
JEON, HYOUNG JO
Executed: 2017-07-06
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Measuring Semiconductor Device