IP Library Assignment 044589/0500
Patent Assignment
Reel/Frame 044589/0500

Assignment of Assignor's Interest

Recorded: 2018-01-10 Pages: 4
Assignors
PANDEV, STILIAN IVANOV
Executed: 2018-01-04
LU, WEI
Executed: 2018-01-04
SHCHEGROV, ANDREI V.
Executed: 2018-01-10
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Process Robust Overlay Metrology Based On Optical Scatterometry
Application: 15/861,938 →
Publication: US 2018/0252514