Patent Assignment
Reel/Frame 044779/0134
Assignment of Assignor's Interest
Recorded: 2018-01-30
Pages: 4
Assignor
CHEN, CHIEN-HUEI
Executed: 2018-01-23
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
NO.8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK,, HSINCHU, 30078, TAIWAN
Covered Property
(1)
Defect Detecting Method and Defect Detecting System