Patent Assignment
Reel/Frame 044805/0699
Assignment of Assignor's Interest
Recorded: 2018-02-01
Pages: 5
Assignors
ASBAG, ASSAF
Executed: 2018-01-02
SHAUBI, OHAD
Executed: 2017-11-22
SAVCHENKO, KIRILL
Executed: 2017-11-22
GAN-OR, SHIRAN
Executed: 2017-11-22
COHEN, BOAZ
Executed: 2017-11-22
ZOHAR, ZEEV
Executed: 2017-11-22
Assignee
APPLIED MATERIALS ISRAEL LTD.
9 OPPENHEIMER STREET, PARK RABIN, REHOVOT, 7670109, ISRAEL
Covered Property
(1)
Method of Classifying Defects in a Semiconductor Specimen and System Thereof