Change of Name

Recorded: 2017-12-15 Pages: 11

Assignor

ALTATECH SEMICONDUCTOR

Executed: 2016-08-12

Assignee

UNITY SEMICONDUCTOR

611 RUE ARISTIDE BERGES, MONTBONNOT-SAINT-MARTIN, 38330, FRANCE

Covered Properties (2)

Device and Method for Inspecting Semiconductor Materials

Patent: 9,816,942 →

Application: 14/350,135 →

Publication: US 2014/0285797

Dark-Field Semiconductor Wafer Inspection Device

Patent: 9,389,189 →

Application: 14/350,978 →

Publication: US 2014/0268121

Related Assignments (2)

Other recorded transfers of the patents in this record — the chain of ownership.