Patent Assignment
Reel/Frame 044988/0807
Assignment of Assignor's Interest
Recorded: 2018-02-21
Pages: 7
Assignors
KIM, YEON-TAE
Executed: 2018-01-17
KIM, DO-HYUNG
Executed: 2018-01-17
YANG, KWANG-HYUN
Executed: 2018-01-17
LEE, CHANG-YUN
Executed: 2018-01-17
CHOI, YOUNG-UK
Executed: 2018-01-17
PARK, KEE-SOO
Executed: 2018-01-17
CHOI, EUN-SOK
Executed: 2018-01-17
Assignee
SAMSUNG ELECTRONICS CO., LTD
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Inspecting Semiconductor Substrate and Method of Manufacturing Semiconductor Device