Patent Assignment
Reel/Frame 045119/0838
Assignment of Assignor's Interest
Recorded: 2018-03-06
Pages: 2
Assignor
TSUCHIYA, HIDEO
Executed: 2018-02-19
Assignee
NUFLARE TECHNOLOGY, INC.
8-1, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI, KANAGAWA, 235-8522, JAPAN
Covered Property
(1)
Electron Beam Inspection Apparatus and Electron Beam Inspection Method