IP Library Assignment 045146/0037
Patent Assignment
Reel/Frame 045146/0037

Assignment of Assignor's Interest

Recorded: 2018-03-08 Pages: 3
Assignors
OMINAMI, YUSUKE
Executed: 2018-01-24
HISADA, AKIKO
Executed: 2017-12-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property (1)
Observation Support Unit for Charged Particle Microscope and Sample Observation Method Using Same
Application: 15/753,685 →
Publication: US 2019/0013177
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →