Patent Assignment
Reel/Frame 045178/0847
Assignment of Assignor's Interest
Recorded: 2018-03-12
Pages: 3
Assignor
HIKICHI, TOMOKI
Executed: 2018-02-15
Assignee
ABLIC INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Magnetic Sensor Circuit, Test Method for the Same, and Manufacturing Method for a Semiconductor Device Having a Magnetic Sensor Circuit