Patent Assignment
Reel/Frame 045324/0665
Assignment of Assignor's Interest
Recorded: 2018-03-23
Pages: 8
Assignors
RHEE, MIN-WOO
Executed: 2017-12-27
KIMM, DUKE
Executed: 2018-01-12
KIM, JAE-HONG
Executed: 2017-12-27
YUN, JI-NYEONG
Executed: 2017-12-27
PARK, IN-KYU
Executed: 2017-12-27
YOON, JUN-BO
Executed: 2017-12-27
KWON, DONG-UK
Executed: 2017-12-27
KIM, SEUNG-HWAN
Executed: 2017-12-27
KIM, CHANG-KEUN
Executed: 2017-12-27
YOON, YONG-HOON
Executed: 2017-12-27
Assignees
SAMSUNG ELECTRONICS CO., LTD
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
291, DAEHAK-RO, YUSEONG-GU, DAEJEON, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Probe Card, Test Apparatus Including the Probe Card, and Related Methods of Manufacturing