IP Library › Assignment 045365/0121
Patent Assignment
Reel/Frame 045365/0121

Change of Name

Recorded: 2017-12-15 Pages: 4
Assignor
ALTATECH SEMICONDUCTOR
Executed: 2016-07-18
Assignee
UNITY SEMICONDUCTOR
611 RUE ARISTIDE BERGÈS, MONTBONNOT SAINT-MARTIN, 38330, FRANCE
Covered Properties (3)
Device and Method for Inspecting Semiconductor Wafers
Patent: 9,007,456 →
Application: 12/992,236 →
Publication: US 2011/0128371
Device and Method for Inspecting Semiconductor Wafers
Patent: 8,654,324 →
Application: 13/203,117 →
Publication: US 2012/0057155
Device and Method for Inspecting Moving Semicondutor Wafers
Patent: 8,817,249 →
Application: 13/696,322 →
Publication: US 2013/0044316
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 10, 2011
From: GASTALDO, PHILIPPE; BERGER, FRANCOIS; SERRECCHIA, CLEONISSE
To: ALTATECH SEMICONDUCTOR
Reel/Frame 025790/0235 →
Assignment of Assignor's Interest Nov 8, 2011
From: GASTALDO, PHILIPPE
To: ALTATECH SEMICONDUCTOR
Reel/Frame 027193/0063 →
Assignment of Assignor's Interest May 25, 2016
From: GASTALDO, PHILIPPE; PERNOT, FREDERIC; PIFFARD, OLIVIER
To: ALTATECH SEMICONDUCTOR
Reel/Frame 038716/0968 →