IP Library › Assignment 045647/0939
Patent Assignment
Reel/Frame 045647/0939

Assignment of Assignor's Interest

Recorded: 2018-04-26 Pages: 5
Assignors
KRYGER, MARC
Executed: 2016-06-24
CHANGALA, JOHN
Executed: 2016-06-24
Assignee
FEMTOMETRIX, INC.
2811 MCGAW AVENUE, IRVINE, CALIFORNIA, 92614
Covered Properties (4)
Field-Biased Second Harmonic Generation Metrology
Application: 15/799,594 →
Publication: US 2018/0217192
Wafer Metrology Technologies
Application: 15/806,271 →
Publication: US 2018/0217193
Charge Decay Measurement Systems and Methods
Application: 15/880,308 →
Publication: US 2018/0292441
Pump and Probe Type Second Harmonic Generation Metrology
Application: 15/882,433 →
Publication: US 2018/0299497
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 26, 2018
From: KOLDIAEV, VIKTOR; KRYGER, MARC; CHANGALA, JOHN
To: FEMTOMETRIX, INC.
Reel/Frame 045648/0286 →
Certificate of Conversion from a Non-Delaware Corporation to a Delaware Corporation Apr 26, 2018
From: FEMTOMETRIX, INC.
To: FEMTOMETRIX, INC.
Reel/Frame 046064/0437 →
Security Interest Nov 4, 2024
From: FEMTOMETRIX, INC.
To: KNOBBE, MARTENS, OLSON & BEAR, LLP
Reel/Frame 069560/0973 →
Release of Security Interest May 27, 2026
From: KNOBBE, MARTENS, OLSON & BEAR, LLP
To: FEMTOMETRIX, INC.
Reel/Frame 074776/0797 →