Patent Assignment
Reel/Frame 045743/0799
Assignment of Assignor's Interest
Recorded: 2018-05-08
Pages: 7
Assignors
PARK, WON JOO
Executed: 2018-02-21
LEE, HYUNG JOO
Executed: 2018-02-21
CHOI, SEUK HWAN
Executed: 2018-02-21
NAM, DONG SEOK
Executed: 2018-02-21
HAN, YOON TAEK
Executed: 2018-02-21
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU,, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Critical Dimension Measurement System and Method of Measuring Critical Dimensions Using Same