Patent Assignment
Reel/Frame 045902/0414
Assignment of Assignor's Interest
Recorded: 2018-05-25
Pages: 6
Assignors
KONYUBA, YUJI
Executed: 2018-05-17
OMOTO, KAZUYA
Executed: 2018-05-18
SAWADA, HIDETAKA
Executed: 2018-05-17
Assignee
JEOL LTD.
3-1-2 MUSASHINO, AKISHIMA, TOKYO, 196-8558, JAPAN
Covered Property
(1)
Distortion Measurement Method for Electron Microscope Image, Electron Microscope, Distortion Measurement Specimen, and Method of Manufacturing Distortion Measurement Specimen