Patent Assignment
Reel/Frame 045932/0870
Assignment of Assignor's Interest
Recorded: 2018-05-30
Pages: 5
Assignors
FUJII, TERUO
Executed: 2018-05-14
KIM, SOO HYEON
Executed: 2018-05-11
OGATA, KEN
Executed: 2018-05-23
Assignee
THE FOUNDATION FOR THE PROMOTION OF INDUSTRIAL SCIENCE
6-1, KOMABA 4-CHOME,, MEGURO-KU,, TOKYO, 1538505, JAPAN
Covered Property
(1)
Microchamber Array Device and Method of Analyzing Inspection Object Using Same