Patent Assignment
Reel/Frame 046122/0197
Assignment of Assignor's Interest
Recorded: 2018-06-18
Pages: 3
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property
(1)
System, Method for Training and Applying Defect Classifiers in Wafers Having Deeply Stacked Layers