Patent Assignment
Reel/Frame 046256/0666
Assignment of Assignor's Interest
Recorded: 2018-07-03
Pages: 3
Assignor
HITACHI, LTD.
Executed: 2018-01-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO,, 105-8717, JAPAN
Covered Properties
(4)
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Charged Particle Beam Equipments, and Charged Particle Beam Microscope
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.