IP Library Assignment 046256/0666
Patent Assignment
Reel/Frame 046256/0666

Assignment of Assignor's Interest

Recorded: 2018-07-03 Pages: 3
Assignor
HITACHI, LTD.
Executed: 2018-01-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO,, 105-8717, JAPAN
Covered Properties (4)
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Patent: 7,462,830 →
Application: 10/912,148 →
Publication: US 2005/0061971
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Patent: 7,476,872 →
Application: 11/775,894 →
Publication: US 2007/0252091
Charged Particle Beam Equipments, and Charged Particle Beam Microscope
Patent: 8,022,365 →
Application: 12/168,940 →
Publication: US 2009/0014651
Method and Apparatus for Observing Inside Structures, and Specimen Holder
Patent: 8,134,131 →
Application: 12/329,661 →
Publication: US 2009/0302234
Related Assignments (2)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Address Jul 3, 2018
From: HITACHI, LTD.
To: HITACHI, LTD.
Reel/Frame 047102/0033 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →