Patent Assignment
Reel/Frame 046291/0450
Assignment of Assignor's Interest
Recorded: 2018-06-04
Pages: 3
Assignor
DOI, SHUUICHI
Executed: 2018-05-30
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8588, JAPAN
Covered Property
(1)
X-Ray Diffraction Analysis Method and X-Ray Diffraction Analysis Apparatus