Patent Assignment
Reel/Frame 046320/0015
Assignment of Assignor's Interest
Recorded: 2018-07-11
Pages: 6
Assignors
KWON, NAMYEONG
Executed: 2018-06-07
KANG, HYOHYEONG
Executed: 2018-06-07
KIM, YONGDEOK
Executed: 2018-06-07
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO, SUWON-SI, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Defect Classification Device, Method for Classifying Defect of Semiconductor, and Semiconductor Defect Classification System