Patent Assignment
Reel/Frame 046375/0934
Assignment of Assignor's Interest
Recorded: 2018-07-17
Pages: 6
Assignors
REED, DAVID A.
Executed: 2018-03-07
SCHUELER, BRUNO W.
Executed: 2018-03-06
NEWCOME, BRUCE H.
Executed: 2018-03-07
SMEDT, RODNEY
Executed: 2018-05-31
BEVIS, CHRIS
Executed: 2017-10-12
Assignee
NOVA MEASURING INSTRUMENTS INC.
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Property
(1)
Systems and Approaches for Semiconductor Metrology and Surface Analysis Using Secondary Ion Mass Spectrometry