IP Library Assignment 046588/0661
Patent Assignment
Reel/Frame 046588/0661

Assignment of Assignor's Interest

Recorded: 2018-08-08 Pages: 2
Assignors
TAKEUCHI, HIROKO
Executed: 2018-06-07
KONDO, AKEMI
Executed: 2018-06-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus Using Focus Evaluation Values for Pattern Length Measurement
Application: 16/040,366 →
Publication: US 2019/0035596
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →