Patent Assignment
Reel/Frame 052398/0249
Change of Name
Recorded: 2020-04-14
Pages: 14
Assignor
HITACHI HIGH-TECHNOLOGIES CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties
(170)
Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing Apparatus
Application:
13/499,983 →
Publication:
US 2012/0182415
Adsorbent and Method for Producing Same
Application:
13/643,926 →
Publication:
US 2013/0048853
Dispensing Nozzle for Autoanalyzer, Autoanalyzer Equipped with the Nozzle, and Method for Producing Dispensing Nozzle for Autoanalyzer
Application:
13/699,552 →
Publication:
US 2013/0171025
Semiconductor Measurement Apparatus and Computer Program
Semiconductor Evaluation Device and Computer Program
Electron Microscope and Sample Movement Device
Application:
14/422,436 →
Publication:
US 2015/0243472
Device for Dust Emitting of Foreign Matter and Dust Emission Cause Analysis Device
Template Creation Device for Sample Observation Device, and Sample Observation Device
Application:
14/898,229 →
Publication:
US 2016/0140287
Charged Particle Beam Apparatus
Application:
14/902,436 →
Publication:
US 2016/0379797
Electrophoresis Medium Receptacle and Electrophoresis Apparatus
Application:
14/914,801 →
Publication:
US 2016/0216235
Cell Culture Apparatus
Application:
15/030,108 →
Publication:
US 2016/0264918
Flow-Type Ion Selective Electrode, Electrolyte Concentration Measuring Device Using the Same, and Biochemical Automatic Analyzer
Test Apparatus
Analysis Device
Application:
15/126,781 →
Publication:
US 2017/0089836
Automatic Analytical Apparatus
Application:
15/126,789 →
Publication:
US 2017/0131306
Hole Formation Method and Measurement Device
Cryostation System
Sequence Data Analyzer, DNA Analysis System and Sequence Data Analysis Method
Cell Dispersion Measurement Mechanism, and Cell Subculture System Utilizing Same
Nucleic Acid Delivery Controlling System and Method for Manufacturing Same, and Nucleic Acid Sequencing Device
Application:
15/517,333 →
Publication:
US 2017/0299548
Exposure Condition Evaluation Device
Recipe Creation Device for Use in Semiconductor Measurement Device or Semiconductor Inspection Device
Pattern Matching Device and Computer Program for Pattern Matching
Multicolor Fluorescence Analysis Device
Nucleic Acid Analyzer
Method for Constructing Nucleic Acid Molecule
Operation Method for Control Materials and Automated Analyzer
Inspection Device
Specimen Transporting Device and Specimen Transporting Method
Charged Particle Beam Device for Moving an Aperture Having Plurality of Openings and Sample Observation Method
Electrophoresis Device and Electrophoresis Method
Sensitivity Measuring Device and Inspection Device
Dynamic Response Analysis Prober Device
Capillary Cartridge and Electrophoresis Apparatus
Charged Particle Beam Device
Far-Infrared Spectroscopy Device
Automated Analyzer and Automated Analysis System
Automatic Analysis Device
Ion-Selective Electrode, Method of Manufacture Thereof, and Cartridge
Charged Particle Beam Device
Biological Sample Analyzer and Biological Sample Analysis Method
Automated Analyzer and Control Method for Same
Componential Analyzer, Drug Efficacy Analyzer, and Analysis Method
Image Processor, Method for Generating Pattern Using Self-Organizing Lithographic Techniques and Computer Program
Ion Beam Device and Cleaning Method for Gas Field Ion Source
Charged Particle Beam Apparatus
Analysis Apparatus
Application:
15/998,963 →
Publication:
US 2019/0329240
Charged Particle Beam Apparatus Using Focus Evaluation Values for Pattern Length Measurement
Pattern Measuring Method and Pattern Measuring Apparatus
Mass Spectrometer
Charged Particle Beam Device
Inspection Device and Detector
Automatic Analyzer and Standard Solution for Evaluating Scattered Light Measurement Optical System Thereof
Sample Holder, Ion Milling Apparatus, Sample Processing Method, Sample Observing Method, and Sample Processing and Observing Method
Overlay Error Measurement Device and Computer Program
Charged Particle Beam Device for Imaging Vias Inside Trenches
Observation Device
Light-Emitting Detection Device
Automatic Analyzer
Dichroic-Mirror Array
Ion Milling Device and Ion Milling Method
Analysis Device Provided with Ion Mobility Separation Part
Automatic Analysis Device
Field Emission Electron Source, Method for Manufacturing Same, and Electron Beam Device
Light Guide, Detector Having Light Guide, and Charged Particle Beam Device
Analysis Device
Automatic Analysis Apparatus
Capillary Electrophoresis Apparatus
Defect Inspection Method and Defect Inspection Device
Pattern Measurement Device and Pattern Measurement Method
Automated Analyzer
Automatic Analysis Device
Specimen Conveyance System and Specimen Conveyance Method
Application:
16/087,364 →
Publication:
US 2021/0208174
Charged Particle Microscope and Method of Imaging Sample
Application:
16/094,281 →
Publication:
US 2021/0233740
Charged Particle Beam Device Having Inspection Scan Direction Based on Scan with Smaller Dose
Charged Particle Beam Device
Application:
16/136,534 →
Publication:
US 2019/0103250
Pattern Measuring Method, Pattern Measuring Apparatus, and Computer Program Storage Device
Charged Particle Beam Apparatus and Method for Adjusting Imaging Conditions for the Same
Image-Forming Device, and Dimension Measurement Device
Far-Infrared Imaging Device and Far-Infrared Imaging Method
Image Evaluation Method and Image Evaluation Device
Charged Particle Beam Device
Charged Particle Beam Apparatus
Beam Irradiation Device
Specimen Holder and Charged Particle Beam Device Provided with Same
Biomolecule Measuring Device
Chromatographic Mass Analysis Device and Control Method
Method for Analyzing State of Cells in Spheroid
Method and Apparatus for Analyzing Biomolecules
Application:
16/307,636 →
Publication:
US 2019/0292589
Automatic Analyzer
Charged Particle Beam Apparatus
Charged Particle Beam Device
Compound for Use in Enzymatic Reaction and Mass Spectrometry Method
Application:
16/312,787 →
Publication:
US 2019/0330140
Pattern Measurement Method and Pattern Measurement Device
Refrigerating/Heating Device, and Analysis Device
Charged Particle Beam Device
Charged-Particle Beam Apparatus
Plug Processing Device and Specimen Test Automation System Including Same
Automatic Analyzer
Application:
16/315,349 →
Publication:
US 2019/0308194
Aberration Correcting Device for an Electron Microscope and an Electron Microscope Comprising Such a Device
Charged Particle Radiation Device
Ion Analysis Device
Image Diagnosis Assisting Apparatus, Image Diagnosis Assisting Method and Sample Analyzing System
Automatic Analyzer
Pattern Measurement Device and Computer Program
Automatic Analysis Apparatus Including A Reaction Container Holding Part Having A Surface That Reflects Light Emitted From A Light Source
Automatic Analysis Device
Pattern Measurement Device, and Computer Program
Sample Test Automation System
Electron Microscope
Pattern Evaluation Apparatus and Computer Program
Application:
16/337,694 →
Publication:
US 2020/0033122
Charged Particle Beam Apparatus and Sample Observation Method Using Superimposed Comparison Image Display
Charged Particle Beam Device
Scanning Electron Microscope
Pattern Measuring Method, Pattern Measuring Tool and Computer Readable Medium
Charged Particle Beam Apparatus
Charged Particle Beam Device and Capturing Condition Adjusting Method in Charged Particle Beam Device
Ion Beam Device
Automatic Analyzer
Automatic Analyzer and Automatic Analysis Method
Automatic Analyzer and Automatic Analysis Method
Automated Analyzer
Charged-Particle Beam Device
Charged Particle Beam Device and Optical Examination Device
Charged Particle Beam Device
Charged Particle Beam Device
Charged Particle Beam Device
Charged-Particle Beam Device
Electron Source and Electron Beam Device Using the Same
Charged Particle Beam Device
Charged Particle Beam Apparatus
Automated Analyzer
Automatic Analysis Device and Cleaning Mechanism in Automatic Analysis Device
Capillary Electrophoresis Apparatus and Thermostat
Automatic Analyzer
Application:
16/487,545 →
Publication:
US 2019/0383842
Charged Particle Beam Apparatus, and Method of Adjusting Charged Particle Beam Apparatus
Charged Particle Beam Device
Application:
16/487,566 →
Publication:
US 2019/0385810
Automatic Analyzer
Sample Container Transfer Device
Automated Analysis System
Charged Particle Beam Device
Charged Particle Beam Device
Linear Motor for Vacuum and Vacuum Processing Apparatus
Charged Particle Beam Device and Method for Setting Condition in Charged Particle Beam Device
Charged Particle Beam Apparatus and Cell Evaluation Method
Imaging Device and Morphological Feature Data Display Method
Sample Processing Device
Application:
16/609,248 →
Publication:
US 2020/0047181
Charged Particle Beam Device
Charged Particle Beam Apparatus and Cleaning Method
Mass Spectrometer and Nozzle Member
Automatic Analyzer and Analysis Method
Charged Particle Beam Device and Sample Thickness Measurement Method
Charged-Particle Beam Device
Test Kit, Test Method, Dispensing Device
Electrophoretic Medium Container
Electron Beam Device
Charged Particle Beam Device and Electrostatic Lens
Far-Infrared Spectroscopy Device
Discharge Chamber for a Plasma Processing Apparatus
Patent:
907,593 →
Application:
29/611,001 →
Clinical Analyzer with Graphical User Interface
Patent:
882,603 →
Application:
29/627,781 →
Ion Shield Plate Base for Semiconductor Manufacturing Apparatus
Patent:
924,824 →
Application:
29/677,728 →
Ion Shield Plate for Semiconductor Manufacturing Apparatus
Patent:
900,760 →
Application:
29/677,753 →
Integrated Type Ion Shield for Semiconductor Manufacturing Apparatus
Patent:
901,407 →
Application:
29/677,764 →
Ring for a Plasma Processing Apparatus
Patent:
891,636 →
Application:
29/688,724 →
Electron Microscope
Patent:
958,215 →
Application:
29/699,268 →
Grounded Electrode for a Plasma Processing Apparatus
Patent:
916,038 →
Application:
29/706,143 →
Clinical Analyzer
Patent:
909,607 →
Application:
29/713,039 →
Clinical Analyzer
Patent:
909,608 →
Application:
29/713,044 →
Clinical Analyzer
Patent:
909,609 →
Application:
29/713,053 →
Sample Supply Unit
Patent:
909,610 →
Application:
29/713,060 →
Related Assignments
(21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 15, 2012
From: TOYODA, YASUTAKA; IKEDA, MITSUJI; ABE, YUICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 028208/0953 →
Assignment of Assignor's Interest
Jan 7, 2013
From: NOJIMA, AKIHIRO; TANIGUCHI, SHINICHI; ISHIZAWA, HIROAKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 029577/0054 →
Assignment of Assignor's Interest
Jan 8, 2013
From: NUNOSHIGE, JUN; KAGAWA, HIROYUKI; ITO, SHINYA; KANDA, KATSUHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 029590/0532 →
Assignment of Assignor's Interest
Aug 25, 2014
From: HONDA, ASUKA; SHINDO, HIROYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 033599/0091 →
Assignment of Assignor's Interest
Sep 9, 2014
From: TOYODA, YASUTAKA; MATSUOKA, RYOICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 033699/0725 →
Assignment of Assignor's Interest
Feb 19, 2015
From: KIKUCHI, HIDEKI; UEDA, KOTA; SAITOU, KOUICHIROU
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 034984/0749 →
Assignment of Assignor's Interest
Jul 22, 2015
From: ANDO, HIROYUKI; ASAGA, YUTA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 036155/0737 →
Assignment of Assignor's Interest
Dec 31, 2015
From: NOMAGUCHI, TSUNENORI; AGEMURA, TOSHIHIDE; YASENJIANG, ZULIHUMA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 037390/0029 →
Assignment of Assignor's Interest
Feb 26, 2016
From: MIYATA, HITOSHI; KATO, TOMOYUKI; SAKURAI, TOSHIYUKI; YAMAZAKI, MOTOHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 037839/0403 →
Assignment of Assignor's Interest
Apr 18, 2016
From: SHIMASE, AKIHIRO; IMAI, KAZUMICHI; TAKADA, EIICHIRO; ASO, SADAMITSU
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 038306/0080 →
Assignment of Assignor's Interest
Jul 15, 2016
From: KISHIOKA, ATSUSHI; ISHIGE, YU; ONO, TETSUYOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039164/0179 →
Assignment of Assignor's Interest
Sep 14, 2016
From: UEMATSU, CHIHIRO; MAESHIMA, MUNEO; MASUYA, AKIRA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039738/0253 →
Assignment of Assignor's Interest
Sep 16, 2016
From: TARUMI, SHINJI; ADACHI, SAKUICHIRO; YABUTANI, CHIE; MAKINO, AKIHISA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039767/0411 →
Assignment of Assignor's Interest
Sep 16, 2016
From: KATO, HIROKAZU; SHOJI, TOMOHIRO; HIGASHINO, HIROYUKI; YAMASHITA, TATSUYA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039767/0179 →
Assignment of Assignor's Interest
Sep 28, 2016
From: ITABASHI, NAOSHI; MIGITAKA, SONOKO; YANAGI, ITARU; AKAHORI, RENA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039875/0835 →
Assignment of Assignor's Interest
Sep 28, 2016
From: NAGAKUBO, YASUHIRA; IWAHORI, TOSHIYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039879/0597 →
Assignment of Assignor's Interest
Oct 3, 2016
From: KIMURA, KOUICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 039921/0302 →
Assignment of Assignor's Interest
Oct 13, 2016
From: OJIMA, YUKI; SUKEGAWA, SHIGEKI; ABE, YUICHI; KAWAHARA, TOSHIKAZU
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 040002/0851 →
Assignment of Assignor's Interest
Jan 5, 2018
From: KISHIMOTO, TAKANORI; TACHIBANA, ICHIRO; SUZUKI, NAOMASA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 044547/0305 →
Assignment of Assignor's Interest
Jul 26, 2018
From: MASUYA, AKIRA; MAESHIMA, MUNEO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 046472/0473 →
Assignment of Assignor's Interest
Dec 6, 2019
From: MIZUHARA, YUZURU; KUROSAWA, KOUICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 051201/0076 →