IP Library Granted Patent US 10,948,347
Granted Patent B2
US 10,948,347 · App. 16/689,802 · Granted Mar 16, 2021

Far-infrared spectroscopy device

Inventors: Kei Shimura (Tokyo, JP); Mizuki Oku (Tokyo, JP); Kenji Aiko (Tokyo, JP)
Assignee: Hitachi High-Tech Corporation
G01J3/108G01J3/0202G01J3/0205G01J3/0208G01J3/0224G01J3/0237G01J3/0264G01J3/0289G01J3/0291G01J3/32G01J3/42G01N21/3581G02F1/37G02F1/39G01J2003/425
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,948,347
App. No.
16/689,802
Granted
Mar 16, 2021
Kind
B2
Abstract

This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.

Claims (7)

1. A far-infrared spectroscopy device, comprising:

an illumination optical system; and

a stage on which a sample is mounted and that is movable in at least one direction, wherein

the illumination optical system is an anamorphic optical system, and

when a wavelength of a first far-infrared light from a variable wavelength far-infrared light source is changed, the stage is moved in accordance with a change in an irradiation position of far-infrared light that is likely to occur on the sample surface, and the first far-infrared light is emitted to the same position of the sample.

2. The far-infrared spectroscopy device according to claim 1 ,

wherein the illumination optical system is an imaging optical system that collimates far-infrared light from the variable wavelength far-infrared light source in a first cross section including an optical axis of the first far-infrared light and condenses the far-infrared light on a sample surface again and is a condensing optical system that condenses far-infrared light from the variable wavelength far-infrared light source on a sample surface in a second cross section orthogonal to the first cross section.

Assignments (1)
CHANGE OF NAME Recorded Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →
Continuity (2)
Division 15743151
Related Publication 20200088577A1 · Mar 19, 2020