Far-infrared spectroscopy device
This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
1. A far-infrared spectroscopy device comprising:
a variable wavelength far-infrared light source that generates first far-infrared light;
an illumination optical system that irradiates a sample with the first far-infrared light;
a nonlinear optical crystal for detection that converts second far-infrared light from the sample into near-infrared light by using pump light; and
a far-infrared light imaging optical system that images the sample on the nonlinear optical crystal for detection, wherein
the variable wavelength far-infrared light source includes two beams of laser light of different wavelengths and a nonlinear optical crystal for generation of far-infrared light,
the variable wavelength far-infrared light source generating far-infrared light by difference frequency generation or parametric generation, by irradiating the two beams of laser light onto the nonlinear optical crystal for generation of far-infrared light,
the illumination optical system is an anamorphic imaging optical system that forms an image of a linear far-infrared-light-emitting region of the variable wavelength far-infrared light source on the sample,
the illumination optical system is constructed by a first, a second and a third cylindrical lenses arranged in this order, and
the second cylindrical lens has its cylindrical axis parallel to a plane defined by the optical axis of the illumination optical system and the linear far-infrared-light-emitting region of the variable wavelength far-infrared light source,
the first and the third cylindrical lenses have their cylindrical axes vertical to that of the second cylindrical lens and form an afocal imaging optical system, and
an irradiation position of the first far-infrared light on the sample does not depend on a wavelength of the first far-infrared light.
2. The far-infrared spectroscopy device according to claim 1 ,
wherein the illumination optical system images a linear far-infrared-light-emitting region formed by the variable wavelength far-infrared light source on a sample surface by reducing a longitudinal direction of the linear region.
3. The far-infrared spectroscopy device according to claim 1 ,
wherein the variable wavelength far-infrared light source includes a solid-state amplifier that amplifies an output of a first laser and a correction lens that corrects a thermal lens effect of the solid-state amplifier, and
the correction lens consists of a concave lens and a convex lens.
4. The far-infrared spectroscopy device according to claim 3 ,
wherein the variable wavelength far-infrared light source further includes a polarization beam splitter, a wavelength plate, and a mirror and is configured such that amplified light transmitted through the solid-state amplifier once is incident on the correction lens, and the light transmitted through the correction lens is reflected by the mirror, transmitted through the correction lens again, and incident on the polarization beam splitter and the wavelength plate through the solid-state amplifier.
5. The far-infrared spectroscopy device according to claim 1 ,
wherein the far-infrared light imaging optical system is an afocal imaging optical system consisting of two lenses and includes a mechanism for moving the lens on the sample side among the two lenses in at least one direction.
6. The far-infrared spectroscopy device according to claim 1 , further comprising:
a sensor that detects near-infrared light converted by the nonlinear optical crystal for detection,
wherein the sensor is an array sensor.
7. The far-infrared spectroscopy device according to claim 1 ,
wherein the variable wavelength far-infrared light source includes an incident angle adjusting optical system consisting of an optical deflector and a single imaging optical element,
one of the two beams of laser light is output light of a variable wavelength laser,
the output light of the variable wavelength laser is configured to form a beam waist at a front focal plane of the single imaging optical element, and
the incident angle adjusting optical system adjusts an incident angle of the output light of the variable wavelength laser to the nonlinear optical crystal for generating far-infrared light.
8. The far-infrared spectroscopy device according to claim 7 ,
wherein the imaging optical element is a concave mirror.
9. The far-infrared spectroscopy device according to claim 1 ,
wherein the first far-infrared light is emitted from a linear light-emitting region in the nonlinear optical crystal for generating far-infrared light,
and the nonlinear optical crystal for generating far-infrared light and the nonlinear optical crystal for detection are located in a same plane and substantially parallel so that the second far-infrared light from the sample is converted to the near-infrared light efficiently in the nonlinear optical crystal for detection.
10. The far-infrared spectroscopy device according to claim 1 ,
wherein the illumination optical system and the far-infrared light imaging optical system bend optical paths of the first and the second far-infrared light to obtain reflected light from the sample and include an optical system that corrects optical path lengths of the first and the second far-infrared light.