IP Library Granted Patent US 10,884,009
Granted Patent B2
US 10,884,009 · App. 16/086,699 · Granted Jan 5, 2021

Automated analyzer

Inventors: Hidetsugu Tanoue (Tokyo, JP); Yoichiro Suzuki (Tokyo, JP)
Assignee: Hitachi High-Tech Corporation
G01N35/1009G01F23/26G01N35/10G01N35/1002G01N35/1065G01N2035/1025
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Quick Facts
Patent No.
US 10,884,009
App. No.
16/086,699
Granted
Jan 5, 2021
Kind
B2
Abstract

In preparation for a case in which the time at which a first reagent probe comes into contact with cleaning liquid and the time at which a second reagent probe comes into contact with cleaning liquid are the same, an automated analyzer is provided with a charge accumulation unit that is provided between a supply port comprising a conductive material that is electrically connected to the cleaning liquids and a device housing and has a capacitance that is greater than or equal to that of the first reagent probe and second reagent probe. As a result, it is possible to prevent interference between the liquid-surface contact determination units of a plurality of probes.

Claims (21)

1. An automated analyzer dispensing and causing a sample and a reagent to react with each other in a reaction container to measure a reacted mixed solution, the automated analyzer comprising:

a plurality of dispensing probes, including reagent probes and sample probes, each of which is configured to dispense a reagent or a sample to be analyzed, respectively, into the reaction container,

a supply port storing conductive liquid with which the reagent probes come into contact,

a conductive-liquid supply unit supplying the conductive liquid, through a flow path connected to the supply port, to the supply port,

a liquid-surface contact determination unit, including a capacitance sensor, installed in each of the plurality of dispensing probes, and determining a contact of a leading end of each of the plurality of dispensing probes with a liquid surface of the conductive liquid, based on a change in capacitance between the leading end and a housing, and

a charge accumulation unit, including a capacitor, provided between the conductive liquid and the housing, and having a capacitance that is equal to or higher than a capacitance of each of the plurality of dispensing probes.

2. The automated analyzer of claim 1 , wherein

the supply port is made of a conductive material, and

the charge accumulation unit is provided between the supply port electrically connected to the conductive liquid and the housing.

3. The automated analyzer of claim 1 , further comprising:

a first conductive member coming into contact with the conductive liquid, wherein

the charge accumulation unit is provided between the first conductive member and the housing.

4. The automated analyzer of claim 1 , further comprising:

a second conductive member provided on the supply port or the conductive-liquid supply unit to come into contact with the conductive liquid, wherein

the charge accumulation unit is provided between the second conductive member and the housing.

5. The automated analyzer of claim 1 , wherein

the charge accumulation unit includes a conductor having the same potential as that of the housing provided parallel with the supply port, and

a dielectric provided between the conductor and the supply port.

6. The automated analyzer of claim 1 , wherein

the conductive-liquid supply unit is formed of a non-conductive member, and

the charge accumulation unit includes a conductor having the same potential as that of the housing provided parallel with the conductive-liquid supply unit.

Assignments (2)
CHANGE OF NAME Recorded Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2018
From: TANOUE, HIDETSUGU; SUZUKI, YOICHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 046927/0792 →
Priority Claims (1)
JP 2016-060068 · Mar 24, 2016 · national
Continuity (1)
Related Publication 20190107549A1 · Apr 11, 2019