Recipe creation device for use in semiconductor measurement device or semiconductor inspection device
The purpose of the present invention is to provide a recipe creation device, with the goal of using past recipe data in order to highly efficiently create recipes. As an embodiment with which to achieve this goal, there is provided a recipe creation device comprising an arithmetic processing device that, on the basis of design data for a semiconductor element, establishes measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device, wherein the arithmetic processing device is configured to be able to access a database in which the measurement conditions or inspection conditions, and the pattern information of the semiconductor element, are stored in associated form, and the measurement conditions or inspection conditions are selected through a search using pattern information of the semiconductor element.
1. A recipe creation device comprising:
an arithmetic processing device that, on the basis of design data for a semiconductor element, establishes measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device and creates the recipe;
an input device for inputting pattern information included in the design data; and
a display device configured to display recipe information of the recipe;
wherein the arithmetic processing device is configured to be able to access a database in which the measurement conditions or inspection conditions, and the inputted pattern information, are stored in associated form, and the measurement conditions or inspection conditions are selected through a search using the inputted pattern information, and to create the recipe based on selected measurement conditions or inspection conditions and the inputted pattern information; and
wherein the arithmetic processing device controls the display device to display the selected measurement conditions or inspection conditions, and at least one of:
a use frequency of the measurement conditions or the inspection conditions; and
a use time of the measurement conditions or the inspection conditions,
as information applied to the selected measurement conditions or inspection conditions.
2. The recipe creation device according to claim 1 ,
wherein the pattern information is a template which is generated on the basis of the design data.
3. The recipe creation device according to claim 1 ,
wherein the arithmetic processing device generates the recipe on the basis of measurement conditions or inspection conditions selected through the search.
4. The recipe creation device according to claim 1 ,
wherein the arithmetic processing device displays measurement conditions or inspection conditions selected through the search on a display device.
5. The recipe creation device according to claim 1 ,
wherein the arithmetic processing device selects the measurement conditions or the inspection conditions on the basis of the recipe information and the pattern information.
6. A method for recipe creation, comprising:
establishing, by an arithmetic processing device, measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device on the basis of design data for a semiconductor element;
inputting, by an input device, pattern information included in the design data;
accessing, by the arithmetic processing device, a database in which the measurement conditions or inspection conditions, and the inputted pattern information, are stored in associated form;
selecting, by the arithmetic processing device, the measurement conditions or inspection conditions through a search using the inputted pattern information, and creating the recipe based on selected measurement conditions or inspection conditions and the inputted pattern information; and
displaying, by a display device, recipe information of the recipe;
wherein the arithmetic processing device controls the display device to display the selected measurement conditions or inspection conditions, and at least one of:
a use frequency of the measurement conditions or the inspection conditions; and
a use time of the measurement conditions or the inspection conditions,
as information applied to the selected measurement conditions or inspection conditions.
7. A non-transitory computer-readable medium storing a program, which when executed by a computer, causes the computer to:
establish measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device on the basis of design data for a semiconductor element;
receive pattern information included in the design data;
access a database in which the measurement conditions or inspection conditions, and the inputted pattern information, are stored in associated form;
select the measurement conditions or inspection conditions through a search using the inputted pattern information, and create the recipe based on selected measurement conditions or inspection conditions and the inputted pattern information; and
display recipe information of the recipe, the selected measurement conditions or inspection conditions, and at least one of:
a use frequency of the measurement conditions or the inspection conditions; and
a use time of the measurement conditions or the inspection conditions,
as information applied to the selected measurement conditions or inspection conditions.