Specimen holder and charged particle beam device provided with same
The present invention addresses a problem of providing a specimen holder capable of observing phenomena on the surface and in the inner part of a specimen, the phenomena being generated in different gas spaces, and a charged particle beam device provided with the specimen holder. In order to solve this problem, a specimen holder for a charged particle beam device which observes a specimen using a charged particle beam is configured such that the specimen holder includes a first gas injection nozzle capable of injecting a first gas to a first portion of a specimen, a second gas injection nozzle capable of injecting a second gas to a second portion of the specimen, the second portion being different from the first portion, and a partition part provided between the first gas injection nozzle and the second gas injection nozzle.
1. A specimen holder for a charged particle beam device which observes a specimen using a charged particle beam, the specimen holder comprising:
a first gas injection nozzle capable of injecting a first gas to a first portion of the specimen,
a second gas injection nozzle capable of injecting a second gas, which is different from the first gas, to a second portion, which is different from the first portion, of the specimen, and
a partition part provided between the first gas injection nozzle and the second gas injection nozzle.
2. The specimen holder according to claim 1 , wherein
a first electrode is electrically connected to a third portion of the specimen positioned closer to the first gas injection nozzle side than the partition part, and
a second electrode is electrically connected to a fourth portion of the specimen positioned closer to the second gas injection nozzle side than the partition part.
3. The specimen holder according to claim 2 , wherein
the first electrode provided separately from the first gas injection nozzle is in contact with the third portion of the specimen, and
the second electrode provided separately from the second gas injection nozzle is in contact with the fourth portion of the specimen.
4. The specimen holder according to claim 2 , wherein
the first gas injection nozzle and the second gas injection nozzle are electrically conductive,
the first electrode is in contact with the first gas injection nozzle and the first gas injection nozzle is in contact with the third portion of the specimen,
the second electrode is in contact with the second gas injection nozzle and the second gas injection nozzle is in contact with the fourth portion of the specimen.
5. The specimen holder according to claim 2 , wherein
the first gas injection nozzle and the second gas injection nozzle are electrically conductive,
the first gas injection nozzle is in contact with the third portion of the specimen,
the second gas injection nozzle is in contact with the fourth portion of the specimen,
the first gas injection nozzle is the first electrode, and the second gas injection nozzle is the second electrode.
6. The specimen holder according to claim 1 , wherein
the partition part is a plate-shaped member.
7. The specimen holder according to claim 1 , wherein
the specimen holder has a film which covers the first and the second gas injection nozzles and the specimen, and
the film adhered to the specimen forms the partition part.
8. The specimen holder according to claim 2 , wherein
the specimen has a thick part and a thin part,
the thick part is used as a contact part that is in contact with the first electrode and the second electrode, and
the thin part is used as an observation part of a transmitted image.
9. The specimen holder according to claim 1 , wherein
the specimen holder holds the specimen by the gas injection nozzles.
10. The specimen holder according to claim 1 , wherein
the specimen holder has a specimen holding part that holds the specimen, and
an outer shell which rotates coaxially with the specimen holding part,
and the outer shell can be inclined at least ±90 degrees.
11. The specimen holder according to claim 1 , wherein
the specimen holder has a specimen supporting film on which the specimen is mounted,
and a heater which heats the specimen is provided on the specimen supporting film.
12. A charged particle beam device including the specimen holder according to claim 1 .
13. An observation method, comprising:
preparing a partition part of a first gas to be injected to a first portion of a specimen and a second gas to be injected to a second portion of the specimen,
injecting the first gas to the first portion,
injecting the second gas to the second portion, and
irradiating the specimen with a charged particle beam.
14. A charged particle beam device comprising:
a first gas injection nozzle capable of injecting a first gas to a first portion of a specimen,
a second gas injection nozzle capable of injecting a second gas, which is different from the first gas, to a second portion, which is different from the first portion, of the specimen, and
a partition part provided between the first gas injection nozzle and the second gas injection nozzle.
15. The charged particle beam device according to claim 14 , wherein
the charged particle beam device is a transmission electron microscope.
16. The charged particle beam device according to claim 14 , wherein
the charged particle beam device is a scanning electron microscope.
17. An observation method, comprising:
preparing a specimen which has a first part with a first thickness and a second part with a second thickness greater than the first thickness,
forming a partition part with a polymer film,
injecting a first gas to the first part of the specimen with a first gas injection nozzle and a second gas to the second part of the specimen with a second gas injection nozzle, wherein the partition part separates the first and second gas injection nozzles from each other,
performing electrical measurement of the specimen, and
irradiating the specimen with a charged particle beam.
18. The observation method according to claim 17 , wherein
the first part is irradiated with the charged particle beam.
19. The observation method according to claim 18 , wherein
a terminal is brought into contact with the second part.
20. The observation method according to claim 17 , wherein
the specimen is prepared by cutting into a wedge shape having the first part and the second part.
21. The observation method according to claim 20 , wherein
the first gas is injected from the side of one side surface of the specimen, and the second gas is injected from the side of the other side surface of the specimen.
22. An observation method, comprising:
preparing a specimen which has a first part with a first thickness and a second part with a second thickness greater than the first thickness,
forming a partition part with a polymer film,
applying a voltage to the specimen,
injecting a first gas to the first part of the specimen with a first gas injection nozzle and a second gas to the second part of the specimen with a second gas injection nozzle, wherein the partition part separates the first and second gas injection nozzles from each other, and
irradiating the specimen with a charged particle beam.
23. The observation method according to claim 22 , wherein
the first part is irradiated with the charged particle beam.
24. The observation method according to claim 23 , wherein
a terminal is brought into contact with the second part.
25. The observation method according to claim 22 , wherein
the specimen is prepared by cutting into a wedge shape having the first part and the second part.
26. The observation method according to claim 25 , wherein
the first gas is injected from the side of one side surface of the specimen, and the second gas is injected from the side of the other side surface of the specimen.