IP Library Granted Patent US 10,613,026
Granted Patent B2
US 10,613,026 · App. 16/245,325 · Granted Apr 7, 2020

Far-infrared imaging device and far-infrared imaging method

Inventor: Kei Shimura (Tokyo, JP)
Assignee: Hitachi High-Technologies Corporation
G01N21/3581G01J1/4228G01J3/0205G01J3/0208G01J3/0224G01J3/108G01J3/2803G01J3/42G01J3/4338
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Quick Facts
Patent No.
US 10,613,026
App. No.
16/245,325
Granted
Apr 7, 2020
Kind
B2
Abstract

Provided are an imaging method and device for imaging using far infrared light that make it possible to quickly image a subject without producing damage or a non-linear phenomenon in the subject. A variable-frequency coherent light source is used, illumination light from the light source is irradiated onto a linear area on an imaging subject, transmitted or reflected light is used to form an image of the imaging subject, a non-linear optical crystal is used for wavelength conversion, and a one-dimensional or two-dimensional array sensor is used to image the imaging subject while the imaging subject is moved in at least one direction.

Claims (13)

1. A far-infrared imaging apparatus, comprising:

a wavelength-tunable far-infrared light source in which a first pump light and a first near-infrared light are incident onto a non-linear optical crystal to generate a first far-infrared light;

an illumination optical system that irradiates the first far-infrared light on a sample;

a far-infrared light imaging optical system that forms an image of the sample;

a detecting non-linear optical crystal onto which a second far-infrared light transmitting through or reflected from the sample and a second pump light are incident, thereby generating a second near-infrared light;

a sensor that detects the image; and

a detecting optical system that introduces light emitted from the detecting non-linear optical crystal onto the sensor, wherein

the second far-infrared light is incident obliquely onto an upper surface of the detecting non-linear optical crystal,

the second pump light is incident onto a side surface of the detecting non-linear optical crystal, and

the side surface of the detecting non-linear optical crystal onto which the second pump light is incident is approximately parallel to an optical axis of the second far-infrared light.

2. The far-infrared imaging apparatus according to claim 1 , wherein the second pump light in incident obliquely onto the side surface of the detecting non-linear optical crystal.

3. The far-infrared imaging apparatus according to claim 2 , wherein an optical axis of the second pump light is incident from the side surface of the detecting non-linear optical crystal, proceeds toward an longitudinal direction of the detecting non-linear optical crystal, and emits from the detecting non-linear optical crystal at another side surface opposite to the side surface.

4. The far-infrared imaging apparatus according to claim 1 , wherein a Si prism is placed on the detecting non-linear optical crystal.

Assignments (1)
CHANGE OF NAME Recorded Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →
Priority Claims (1)
JP 2014-026037 · Feb 14, 2014 · national
Continuity (2)
Continuation 15100441
Related Publication 20190145892A1 · May 16, 2019