Charged particle beam device
An object of the invention is to provide a device for observing the same field of view with a charged particle beam device and a camera without increasing a size of a housing. A charged particle beam device according to an aspect of the invention includes: a lens barrel that irradiates a sample with a charged particle beam; an imaging unit that images an optical image of the sample; a sample table on which the sample is placed; and a stage that is movable and on which the sample table is placed, wherein when a distance between a physical central axis of the sample table and a physical optical axis of the imaging unit is defined as a first distance, and a distance between a virtual central axis of the sample table and a physical central axis of the imaging unit, or between the physical central axis of the sample table and a virtual central axis of the imaging unit, or between the virtual central axis of the sample table and the virtual central axis of the imaging unit is defined as a second distance, the second distance is shorter than the first distance.
1. A charged particle beam device, comprising:
a lens barrel that irradiates a sample with a charged particle beam;
an imaging unit that images an optical image of the sample;
a sample table on which the sample is placed;
a stage that is movable and on which the sample table is placed, wherein
the sample table includes a sample base portion that is arranged below a lower end of the sample table and placed on the stage, and a disposition table arranged above an upper end of the sample table, an observation portion of the sample being located at a center of the disposition table, and
a distance q between a central axis of the sample base portion and a central axis of the disposition table satisfies q≥L−a, L being a distance between an optical axis of the lens barrel and an optical axis of the imaging unit and a being a distance that the stage is moved;
a housing that supports the lens barrel; and
a mirror that is disposed between the lens barrel and the imaging unit, wherein
the imaging unit is disposed on a side surface of the housing and includes an imaging lens with respect to the mirror, and the optical axis of the imaging unit is an optical axis reflected by the mirror.
2. The charged particle beam device according to claim 1 , wherein
q=L−a.
3. The charged particle beam device according to claim 1 , further comprising:
a rotation preventing pin that fixes the sample table at an angle.
4. The charged particle beam device according to claim 1 , wherein
the stage rotates around a central axis of the sample table that is taken as a rotation axis.
5. The charged particle beam device according to claim 1 , wherein the disposition table is connected to the sample table via an adjustment screw.
6. A charged particle beam device, comprising:
a lens barrel that irradiates a sample with a charged particle beam in a height direction of the charged particle beam device;
a housing that supports the lens barrel;
an imaging unit that is disposed on a side surface of the housing and images an optical image of the sample;
a mirror that is disposed between the lens barrel and the imaging unit, wherein
the mirror is disposed in a position where the mirror overlaps with a portion of the lens barrel in length and width directions of the charged particle beam device,
a sample table on which the sample is placed, the sample table including a sample base portion that is arranged below a lower end of the sample table and placed on the stage, and a disposition table arranged above an upper end of the sample table, an observation portion of the sample being located at a center of the disposition table; and
a stage that is movable and on which the sample table is placed, wherein a distance L″ between an optical axis of the lens barrel and an optical axis of the imaging unit that is reflected by the mirror satisfies L″≤a, a being a distance that the stage is moved.
7. The charged particle beam device according to claim 6 , wherein
L″=a.