Charged particle beam apparatus
Provided is a charged particle beam apparatus, aiming at obtaining an image and the like focused on the sample surface and the bottom while preventing the visual field deviation occurred when focusing on the sample surface and the bottom respectively. The charged particle beam apparatus forms a first image ( 301 ), which is based on detection of the first energy charged particles, based on an irradiation with a beam whose focus is adjusted on a sample surface side, forms a second image ( 304 ) which is based on detection of second energy charged particles having a relatively higher energy than the first energy and a third image ( 303 ) which is based on the detection of the first energy charged particles, based on the irradiation with a beam whose focus is adjusted on a bottom side of a pattern included in the sample, acquires a deviation between the first image and the third image, and composes the first image and the second image so as to correct the deviation.
1. A charged particle beam apparatus including: lenses which focus a charged particle beam emitted from a charged particle source; detectors which detect charged particles obtained based on irradiating of a sample with the charged particle beam; arithmetic processing units which generate an image of an irradiation area of the charged particle beam based on an output of the detectors; and a control unit which controls the lenses,
wherein the arithmetic processing units: form a first image, which is based on detection of first energy charged particles, based on the irradiation with a beam whose focus is adjusted on a sample surface side by the control unit; form a second image which is based on detection of second energy charged particles having a relatively higher energy than the first energy and a third image which is based on the detection of the first energy charged particles, based on the irradiation with a beam whose focus is adjusted on a bottom side of a pattern included in the sample by the control unit; acquire a deviation between the first image and the third image; and compose the first image and the second image so as to correct the deviation.
2. The charged particle beam apparatus according to claim 1 , comprising:
a first detector which detects the charged particles having the first energy in the charged particles emitted from the sample, and
a second detector which detects the charged particles having the second energy which is relatively higher than the first energy.
3. The charged particle beam apparatus according to claim 1 ,
wherein the arithmetic processing units selectively take a bottom of the pattern as a focus evaluation area to perform a focus evaluation.
4. The charged particle beam apparatus according to claim 3 ,
wherein the arithmetic processing units set a pattern bottom area included in the first image as the focus evaluation area.
5. The charged particle beam apparatus according to claim 3 ,
wherein the arithmetic processing units set an area having a brightness value less than or equal to a predetermined value in the first image as the focus evaluation area.
6. The charged particle beam apparatus according to claim 3 ,
wherein the arithmetic processing units set an area having a brightness value more than or equal to a predetermined value in the first image as a mask area which is not an object of the focus evaluation.
7. A charged particle beam apparatus including: lenses which focus a charged particle beam emitted from a charged particle source; detectors which detect charged particles obtained based on irradiating of a sample with the charged particle beam; arithmetic processing units which generate an image of an irradiation area of the charged particle beam based on an output of the detectors; and a control unit which controls the lenses,
wherein the arithmetic processing units: form a first image, which is based on detection of first energy charged particles, based on the irradiation with a beam whose focus is adjusted on a sample surface side by the control unit; forma second image which is based on detection of second energy charged particles having a relatively higher energy than the first energy, based on the irradiation with the beam whose focus is adjusted on a bottom side of a pattern included in the sample by the control unit; and acquire a composite ratio of the first image and the second image based on brightness distribution information of the first image.
8. The charged particle beam apparatus according to claim 7 ,
wherein the arithmetic processing units increase a ratio of the first image and compose with the second image as the brightness of the first image increases depending on the brightness distribution information of the first image.
9. The charged particle beam apparatus according to claim 7 ,
wherein the arithmetic processing units: normalize the brightness distribution information of the first image; and increase the ratio of the first image while decreasing a ratio of the second image, as a normalized value increases, and compose the first image with the second image.
10. The charged particle beam apparatus according to claim 7 ,
wherein the arithmetic processing units: form a third image, which is based on the detection of the first energy charged particles, based on the irradiation with the beam whose focus is adjusted on the bottom side of the pattern included in the sample by the control unit; weighted multiply inversion information obtained by inverting a brightness distribution of the third image to the second image; and compose the weighted multiplied second image with the first image.
11. A charged particle beam apparatus including: lenses which focus a charged particle beam emitted from a charged particle source; detectors which detect charged particles obtained based on irradiating of a sample with the charged particle beam; arithmetic processing units which generate an image of an irradiation area of the charged particle beam based on an output of the detectors; and a control unit which controls the lenses,
wherein the arithmetic processing units: form a first image, which is based on detection of first energy charged particles, based on the irradiation with a beam whose focus is adjusted on a sample surface side by the control unit; form a second image which is based on detection of second energy charged particles having a relatively higher energy than the first energy and a third image which is based on the detection of the first energy charged particles, based on the irradiation with a beam whose focus is adjusted on a bottom side of a pattern included in the sample by the control unit; weighted multiply inversion information obtained by inverting a brightness distribution of the third image to the second image; and compose the weighted multiplied second image with the first image.