IP Library Granted Patent US 12,215,308
Granted Patent B2
US 12,215,308 · App. 16/604,908 · Granted Feb 4, 2025

Charged particle beam apparatus and cell evaluation method

Inventors: Akira Ikeuchi (Tokyo, JP); Shigeru Kawamata (Tokyo, JP); Hiromi Mise (Tokyo, JP); Akira Sawaguchi (Miyazaki, JP)
Assignee: Hitachi High-Tech Corporation
C12M41/46G01N33/4833G06T7/62G06T7/64H01J37/222H01J37/26H01J2237/221
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Quick Facts
Patent No.
US 12,215,308
App. No.
16/604,908
Granted
Feb 4, 2025
Kind
B2
Abstract

Provided is a charged particle beam apparatus capable of more objectively and highly accurately calculating a feature of a cell from an observation image of a cell and evaluating a cell. The charged particle beam apparatus includes an image acquisition unit 18 that acquires an image of a cell, a contour extraction unit 19 that extracts a contour of the image, a feature calculation unit 20 that calculates a morphological feature of the contour based on the contour and calculates the feature of an internal structure such as a cytoplasm contained in an internal area of the contour, and a determination unit 21 that determines quality and/or functionality of the cell based on the feature, and can objectively and highly accurately evaluate the quality and/or the functionality of the cell included in the captured image.

Claims (19)

1. A charged particle beam apparatus comprising:

a computer processor; and

a memory storing a program that when executed by the computer processor causes the computer processor to:

acquire a cross-sectional image of a cell based on a signal, including a reflected electron or a secondary electron, detected by a detector of the charged particle beam apparatus;

determine a quality and/or a functionality of the cell based on a feature in the acquired image;

extract a contour of the cell based on the acquired image; and

calculate, as the feature, a morphological feature of the contour based on the extracted contour and a feature of an internal structure included in an internal area of the contour;

wherein the cell is a differentiated cell generated from undifferentiated cells;

wherein the differentiated cell is a platelet, the quality of the platelet shows a presence or absence of hemostatic ability, and the functionality of the platelet shows a size of the hemostatic ability; and

wherein the morphological feature of the contour shows roundness of the platelet outline, and the feature of the internal structure includes an area ratio of an open canalicular system of the platelet, an expansion degree of the open canalicular system, and an area ratio of a deep dyeing region of the platelet; and

wherein the computer processor determines the quality of the platelet and/or the functionality of the platelet based on the morphological feature and the feature of the internal structure.

2. The charged particle beam apparatus according to claim 1 , wherein

the computer processor calculates the morphological feature showing the roundness of the platelet outline from the area and the circumference of the platelet.

3. The charged particle beam apparatus according to claim 1 , wherein

the computer processor calculates as the feature, the area ratio of the open canalicular system, which is a proportion of a total area of the open canalicular system to the area of the platelet.

4. The charged particle beam apparatus according to claim 1 , wherein

the computer processor calculates as the feature, the expansion degree of the open canalicular system, which is the maximum diameter of the open canalicular system with respect to the diameter of the platelet.

5. The charged particle beam apparatus according to claim 1 , wherein

the computer processor calculates as the feature, the deep dyeing region, which is an area showing secretory granules and mitochondria of the platelets.

Assignments (2)
CHANGE OF NAME Recorded Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 16, 2019
From: IKEUCHI, AKIRA; KAWAMATA, SHIGERU; MISE, HIROMI; SAWAGUCHI, AKIRA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 050736/0184 →
Continuity (1)
Related Publication 20200056141A1 · Feb 20, 2020
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