Charged particle beam device
A charged particle beam device includes: a charged particle source that emits a charged particle beam; a boosting electrode disposed between the charged particle source and a sample to form a path of the charged particle beam and to accelerate and decelerate the charged particle beam; a first pole piece that covers the boosting electrode; a second pole piece that covers the first pole piece; a first lens coil disposed outside the first pole piece and inside the second pole piece to form a first lens; a second lens coil disposed outside the second pole piece to form a second lens; and a control electrode formed between a distal end portion of the first pole piece and a distal end portion of the second pole piece to control an electric field formed between the sample and the distal end portion of the second pole piece.
1. A charged particle beam device, comprising:
a charged particle source that emits a charged particle beam;
a boosting electrode disposed between the charged particle source and a sample to form a path of the charged particle beam and accelerate and decelerate the charged particle beam;
a first pole piece that covers the boosting electrode;
a second pole piece that covers the first pole piece;
a first lens coil disposed outside the first pole piece and inside the second pole piece to form a first lens;
a second lens coil disposed outside the second pole piece to form a second lens; and
a control electrode formed between a distal end portion of the first pole piece and a distal end portion of the second pole piece to control an electric field formed between the sample and the distal end portion of the second pole piece;
wherein the second pole piece includes two to four through holes that are axisymmetric on a side surface of the second pole piece and introduce a voltage to the control electrode.
2. The charged particle beam device according to claim 1 , wherein the first lens is a non-immersion type lens and the second lens is an immersion type lens.
3. The charged particle beam device according to claim 1 , further comprising:
a division unit detachably formed on the charged particle beam device, wherein the division unit includes a distal end portion of the second pole piece on the sample side.
4. The charged particle beam device according to claim 3 , wherein
the division unit further includes the control electrode and a distal end portion of the boosting electrode on the sample side.
5. The charged particle beam device according to claim 3 , wherein
a component is insertable into the charged particle beam device into a division position between the division unit and the charged particle source.
6. A charged particle beam device, comprising:
a charged particle source that emits a charged particle beam;
a boosting electrode disposed between the charged particle source and a sample to form a path of the charged particle beam and accelerate and decelerate the charged particle beam;
a first pole piece that covers the boosting electrode;
a second pole piece that covers the first pole piece;
a first lens coil disposed outside the first pole piece and inside the second pole piece to form a first lens;
a second lens coil disposed outside the second pole piece to form a second lens;
a control electrode formed between a distal end portion of the first pole piece and a distal end portion of the second pole piece to control an electric field formed between the sample and the distal end portion of the second pole piece; and
a division unit detachably formed on the charged particle beam device, wherein
the division unit includes a distal end portion of the second pole piece on the sample side,
a component is insertable into the charged particle beam device into a division position between the division unit and the charged particle source, and
the component is a detector that detects charged particles generated from the sample.
7. A charged particle beam device, comprising:
a charged particle source that emits a charged particle beam;
a boosting electrode disposed between the charged particle source and a sample to form a path of the charged particle beam and accelerate and decelerate the charged particle beam;
a first pole piece that covers the boosting electrode;
a second pole piece that covers the first pole piece;
a first lens coil disposed outside the first pole piece and inside the second pole piece to form a first lens;
a second lens coil disposed outside the second pole piece to form a second lens;
a control electrode formed between a distal end portion of the first pole piece and a distal end portion of the second pole piece to control an electric field formed between the sample and the distal end portion of the second pole piece; and
a division unit detachably formed on the charged particle beam device, wherein
the division unit includes a distal end portion of the second pole piece on the sample side,
a component is insertable into the charged particle beam device into a division position between the division unit and the charged particle source, and
the component is a throttle hole for vacuum differential exhaustion.
8. The charged particle beam device according to claim 5 , wherein the component is a deflector that deflects a charged particle beam.
9. The charged particle beam device according to claim 1 , wherein
the boosting electrode, the control electrode, the second pole piece, and the sample are disposed electrically independent of one another, and V s ≤V c ≤V b is satisfied when a voltage applied to the sample is defined as V s , a voltage applied to the control electrode is defined as V c , and a voltage applied to the boosting electrode is defined as V b .
10. The charged particle beam device according to claim 1 , wherein
the distal end portions of the first and second pole pieces on the sample side, and distal end portions of the boosting electrode and the control electrode on the sample side have an axisymmetric hollow cone shape,
the distal end portion of the boosting electrode on the sample side is located between the distal end portion of the first pole piece on the sample side and the distal end portion of the second pole piece on the sample side, and
the distal end portion of the control electrode on the sample side is located between the distal end portion of the boosting electrode on the sample side and the distal end portion of the second pole piece on the sample side.