Charged particle beam apparatus
A charged particle beam device is provided that performs proper beam adjustment while suppressing a decrease in MAM time, with a simple configuration without adding a lens, a sensor, or the like. The charged particle beam device includes: an optical element which adjusts a charged particle beam emitted from a charged particle source; an adjustment element which adjusts an incidence condition of the charged particle beam with respect to the optical element; and a control device which controls the adjustment element, wherein the control device determines a difference between a first feature amount indicating a state of the optical element based on the condition setting of the optical element, and a second feature amount indicating a state where the optical element reaches based on the condition setting and executes adjustment by the adjustment element when the difference is greater than or equal to a predetermined value.
1. A charged particle beam device comprising:
an optical element configured to adjust a charged particle beam emitted from a charged particle source;
an adjustment element configured to adjust the charged particle beam incident on the optical element; and
a control device configured to control the adjustment element, wherein
the control device obtains an extent of deviation from an equilibrium temperature of the optical element based on a condition setting of the optical element and executes adjustment with the adjustment element when the extent of deviation satisfies a predetermined condition.
2. The charged particle beam device according to claim 1 , wherein the control device executes the adjustment with the adjustment element based on threshold determination of the extent of deviation.
3. The charged particle beam device according to claim 1 , wherein the control device records date and time and the extent of deviation when the adjustment with the adjustment element is executed.
4. The charged particle beam device according to claim 1 , wherein the adjustment element is configured to adjust an incidence condition of the charged particle beam incident on the optical element.
5. The charged particle beam device according to claim 4 , wherein the incidence condition is at least one of an acceleration voltage, an incident current, and a depth of focus of the electron beam.
6. The charged particle beam device according to claim 4 , wherein the control device continuously traces or calculates temperature fluctuation of the optical element based on the condition setting and the incidence condition.
7. The charged particle beam device according to claim 6 , wherein the control device displays execution result of the adjustment with the adjustment element together with chorological change of the temperature fluctuation.
8. The charged particle beam device according to claim 7 , wherein the control device displays at least one of a length measurement value, resolution, a focus value, and length measurement reproducibility together with chorological change of the temperature fluctuation.
9. The charged particle beam device according to claim 1 , wherein the control device measures a length of a measurement point based on a length measurement recipe after executing the adjustment with the adjustment element.
10. The charged particle beam device according to claim 1 , wherein the control device obtains elapsed time from previous adjustment time with the adjustment element, and executes the adjustment with the adjustment element in a case where the elapsed time is a predetermined value or more.
11. The charged particle beam device according to claim 1 , wherein the optical element is an objective lens.
12. The charged particle beam device according to claim 1 , wherein the optical element is an element which performs at least one of focus adjustment, astigmatism correction, and axis adjustment of the electron beam.