IP Library › Granted Patent US 958,215
Granted Patent S1
US 958,215 · App. 29/699,268 · Granted Jul 19, 2022

Electron microscope

Inventors: Akira Kojima (Tokyo, JP); Junpei Hokari (Tokyo, JP); Ai Masuda (Tokyo, JP); Takashi Yamamoto (Tokyo, JP); Tatsuya Hirato (Tokyo, JP); Noriyasu Chinone (Tokyo, JP)
Assignee: Hitachi High-Tech Corporation
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Quick Facts
Patent No.
US 958,215
App. No.
29/699,268
Granted
Jul 19, 2022
Kind
S1
Claims (1)

The ornamental design for an electron microscope, as shown and described.

Assignments (2)
CHANGE OF NAME Recorded Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2019
From: KOJIMA, AKIRA; HOKARI, JUNPEI; MASUDA, AI; YAMAMOTO, TAKASHI; HIRATO, TATSUYA; CHINONE, NORIYASU
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 050843/0438 →
Priority Claims (1)
JP 2019-001638 · Jan 29, 2019 · national