Charged particle beam device and method for setting condition in charged particle beam device
To assist an operator in setting an observation conditions, so as to acquire an image with a desired image quality (such as contrast) in a charged particle beam device without falling into trial and error based on the experience of the operator. Therefore, the charged particle beam device includes a stage 115 on which a sample is placed, a charged particle optical system configured to irradiate the sample with a charged particle beam, detectors 121 and 122 configured to detect an electron generated by an interaction between the charged particle beam and the sample, a control unit 103 configured to control the stage and the charged particle optical system according to an observation condition set by the operator and configured to form an image based on a detection signal from the detectors, and a display 104 configured to display an observation assist screen for setting the observation condition. The control unit displays, on the observation assist screen 401 , information 510 related to an irradiation electron amount per pixel irradiated onto the sample by the charged particle optical system under the observation condition.
1. A charged particle beam device, comprising:
a stage on which a sample is placed;
a charged particle optical system configured to irradiate the sample with a charged particle beam;
a detector configured to detect an electron generated by an interaction between the charged particle beam and the sample;
a control unit configured to control the stage and the charged particle optical system according to an observation condition set by an operator, and configured to form an image based on a detection signal from the detector; and
a display configured to display an observation assist screen for setting the observation condition, wherein
the control unit displays, on the observation assist screen, information related to an irradiation electron amount per pixel irradiated onto the sample by the charged particle optical system under the observation condition,
the control unit displays, on the observation assist screen, at least one of a number of irradiation electrons per pixel, a number of irradiation electrons per unit length of scanning and a number of irradiation electrons per unit area as the information related to the irradiation electron amount per pixel, and
information related to an irradiation electron amount per pixel under a search condition for searching a field of view according to the observation image is displayed on the observation assist screen.
2. The charged particle beam device according to claim 1 , wherein
the control unit also displays, on the observation assist screen, a related parameter that influences an image quality of the image.
3. The charged particle beam device according to claim 2 , further comprising:
an operation unit configured to receive input from the operator, wherein
the control unit displays, on the observation assist screen, information related to the irradiation electron amount per pixel irradiated onto the sample by the charged particle optical system under an observation condition to which the related parameter that is edited by the operation unit on the observation assist screen is applied.
4. The charged particle beam device according to claim 3 , wherein
the control unit receives an instruction from the operation unit and controls the stage and the charged particle optical system according to the observation condition to which the related parameter edited by the operation unit is applied.
5. The charged particle beam device according to claim 3 , wherein
the control unit includes a scan mode storage unit configured to store a predetermined scan mode, and
the control unit stores a scan mode to which the related parameter edited by the operation unit is applied as an original scan mode in the scan mode storage unit, and is capable of reading the predetermined scan mode or the original scan mode when setting the observation condition.
6. The charged particle beam device according to claim 1 , wherein
the control unit reads an observation condition included in supplementary information in association with an image stored as an electronic file, and displays, on the observation assist screen, the information related to the irradiation electron amount per pixel irradiated onto the sample by the charged particle optical system under the observation condition included in the supplementary information.
7. A method for setting a condition in a charged particle beam device, the method comprising:
displaying, on a display, a user interface screen including a condition setting unit configured to set an observation condition for the charged particle beam device and an image display unit configured to display an observation image by the charged particle beam device;
displaying, on the display, an observation assist screen including information related to an irradiation electron amount per pixel under an observation condition of the observation image; and
receiving an instruction from an operation unit, and displaying, on the observation assist screen, information related to an irradiation electron amount per pixel under an image capture condition for capturing the observation image;
wherein at least one of a number of irradiation electrons per pixel, a number of irradiation electrons per unit length of scanning and a number of irradiation electrons per unit area is displayed on the observation assist screen as the information related to the irradiation electron amount per pixel; and
wherein information related to an irradiation electron amount per pixel under a search condition for searching a field of view according to the observation image is displayed on the observation assist screen.
8. The method for setting a condition in a charged particle beam device according to claim 7 , further comprising:
displaying, on the observation assist screen, a related parameter that influences an image quality of the observation image or a captured image acquired by capturing the observation image;
editing, by the control unit, the related parameter displayed on the observation assist screen; and
displaying, on the observation assist screen, information related to the irradiation electron amount per pixel under an observation condition to which the related parameter edited by the operation unit is applied.
9. The method for setting a condition in a charged particle beam device according to claim 8 , further comprising:
receiving an instruction from the operation unit, and displaying the observation image or acquiring the captured image under an observation condition to which the related parameter edited by the operation unit is applied.
10. The method for setting a condition in a charged particle beam device according to claim 8 , further comprising:
storing a scan mode to which the related parameter edited by the operation unit is applied as an original scan mode.
11. The charged particle beam device according to claim 1 , wherein
an observation image of a field of view on the sample searched under an observation scan mode is captured under a capture scan mode; and
the control unit displays, on the observation assist screen, information related to the irradiation electron amount per pixel under the observation condition according to the observation scan mode and information related to the irradiation electron amount per pixel under the observation condition according to the capture scan mode.
12. A charged particle beam device, comprising:
a stage on which a sample is placed;
a charged particle optical system configured to irradiate the sample with a charged particle beam;
a detector configured to detect an electron generated by an interaction between the charged particle beam and the sample;
a control unit configured to control the stage and the charged particle optical system according to an observation condition set by an operator, and configured to form an image based on a detection signal from the detector; and
a display configured to display an observation assist screen for setting the observation condition; wherein
an observation image of a field of view on the sample searched under an observation scan mode is captured under a capture scan mode;
the control unit displays, on the observation assist screen, information related to an irradiation electron amount per pixel irradiated onto the sample by the charged particle optical system under the observation condition according to the observation scan mode and information related to the irradiation electron amount per pixel under the observation condition according to the capture scan mode; and
information related to an irradiation electron amount per pixel under a search condition for searching a field of view according to the observation image is displayed on the observation assist screen.