Electron Microscope and Sample Movement Device
The present invention is intended to reduce drift in a sample which occurs because of distortion in an O-ring which seals off from the atmosphere a sample chamber in which vacuum is retained. Provided is an electron microscope, wherein a sample holder ( 2 ) is inserted in a column ( 1 ), comprising: an O-ring ( 4 ) which makes airtight the column ( 1 ) of the electron microscope and the sample holder ( 2 ); a slider tube ( 30 ) which slides in the longitudinal direction of the sample holder ( 2 ) and positions the sample holder in the longitudinal direction; a bellows ( 32 ) which makes airtight the slider tube ( 30 ) and the column ( 1 ); a means ( 10 ) for driving the slider ( 30 ) in the longitudinal direction of the sample holder ( 2 ); and a holder umping part ( 40 ) which positions the sample holder ( 2 ) in the longitudinal direction. The electron microscope further comprises a sample movement device which has an elastic material ( 31 ) which connects the holder umping part ( 40 ) and the slider tube ( 30 ).
1 . An electron microscope with a sample holder being inserted into a column, the electron microscope comprising:
an O-ring which makes airtight said column of the electron microscope and said sample holder;
a slider tube which slides in a longitudinal direction of said sample holder and performs positioning of the sample holder in the longitudinal direction;
a bellows which makes airtight said slider tube and said column;
a driving unit which drives the slider tube in the longitudinal direction of the sample holder;
a touching member which performs position determination of the sample holder in the longitudinal direction; and
a sample movement device which has an elastic material for connection of said touching member and said slider tube.
2 . The electron microscope of claim 1 , further comprising
a drive mechanism which drives said sample holder in such a way as to perform damped vibration in the direction of insertion of said sample holder.
3 . The electron microscope of claim 1 , further comprising
a fixing member which returns the sample holder to a position for removal of distortion of said O-ring and fixes said sample holder at a position at which the distortion of said O-ring disappears.
4 . The electron microscope of claim 1 , further comprising
one or more than one raised portion provided at a leading end of said slider tube and in that said raised portion is compressed against said touching member.
5 . The electron microscope of claim 1 , wherein said touching member is disposed on atmosphere pressure side.
6 . A sample movement device of an electron microscope comprising:
an O-ring which makes airtight said column of the electron microscope and said sample holder;
a slider tube which slides in a longitudinal direction of said sample holder and performs positioning of the sample holder in the longitudinal direction;
a bellows which makes airtight said slider tube and said column;
a driving unit which drives the slider tube in the longitudinal direction of the sample holder;
a touching member which performs position determination of the sample holder in the longitudinal direction; and
an elastic material which performs connection of said touching member and said slider tube.
7 . The sample movement device of claim 6 , further comprising
a drive mechanism which drives said sample holder in such a way as to perform damped vibration in a direction of insertion of said sample holder.