IP Library Granted Patent US 10,593,512
Granted Patent B2
US 10,593,512 · App. 16/082,745 · Granted Mar 17, 2020

Light guide, detector having light guide, and charged particle beam device

Inventors: Yoshifumi Sekiguchi (Tokyo, JP); Shin Imamura (Tokyo, JP); Hajime Kawano (Tokyo, JP); Shahedul Hoque (Tokyo, JP)
Assignee: Hitachi High-Technologies Corporation
H01J37/244H01J37/28H01J2237/2443H01J2237/2445
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Quick Facts
Patent No.
US 10,593,512
App. No.
16/082,745
Granted
Mar 17, 2020
Kind
B2
Abstract

The present invention provides a light guide capable of guiding light generated by a scintillator at high efficiency to a photoreceiving element, a detector, and a charged particle beam device. For attaining the purpose, the present invention proposes a light guide that guides light generated by a scintillator to a photoreceiving element, provided with a scintillator containment portion formed of a first surface facing a surface opposite to a charged particle incident surface of the scintillator and a second surface facing a surface different from the surface opposite to the charged particle incident surface of the scintillator, and a tilted surface reflecting light incident from the second surface to the inside of the light guide.

Claims (17)

1. A light guide for guiding light generated from a scintillator to a photoreceiving element, comprising:

a scintillator containment portion formed of a first surface facing a surface opposite to a charged particle incident surface of the scintillator and a second surface facing a surface different from the surface opposite to the charged particle incident surface of the scintillator; and a tilted surface for reflecting light incident from the second surface to the inside of the light guide;

a bent portion for guiding light incident from the first surface and the second surface to different directions;

an emission surface formed to a position facing the photoreceiving element;

a linear portion for guiding light to the emission surface; and

a tilted portion formed between the linear portion and the bent portion.

2. The light guide according to claim 1 , wherein the first surface is larger than the second surface.

3. The light guide according to claim 1 , wherein the tilted surface is provided with a reflection member.

4. The light guide according to claim 1 , wherein the tilted surface is formed of a plurality of surfaces in different directions or a curved surface.

5. The light guide according to claim 1 , wherein the tilted surface situated outside of the bent portion is formed such that a relative angle between the incident light and the emission light is narrower relative to the tilted surface positioned inward of the bent portion.

6. A charged particle beam device comprising a light guide having a light incident surface, an emission surface for emitting light incident from the incident surface, and a surface for guiding light incident from the incidence surface to the emission surface, wherein

the surface has a curved outer surface starting from the end of the incident surface, and

the curved outer surface has a tangential line tilted from the normal line on the incident surface to the incident surface at a contact between the curved outer surface and the incident surface, and

a scintillator containment space including the incident surface and a side wall surface having a surface direction in the direction different from the incident surface and a reflection surface for reflecting light incident from the side wall surface are formed.

7. The charged particles beam device according to claim 6 , wherein the reflection surface is in a shape of reflecting light twice or more.

8. The charged particle beam device according to claim 6 , wherein a curved surface is present to a portion of the light guide between the incident surface and the emission surface.

9. The charged particle beam device according to claim 6 , wherein the curved outer surface has a portion capable of approximating with an equation of a circle and the center of the circle is not present in a plane parallel with the incident surface.

Assignments (2)
CHANGE OF NAME Recorded Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 6, 2018
From: SEKIGUCHI, YOSHIFUMI; IMAMURA, SHIN; KAWANO, HAJIME; HOQUE, SHAHEDUL
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 046806/0869 →
Priority Claims (1)
JP 2016-069943 · Mar 31, 2016 · national
Continuity (1)
Related Publication 20190115186A1 · Apr 18, 2019