Charged particle beam device
The scanning charged particle beam microscope according to the present application is characterized in that, in acquiring an image of the FOV (field of view), interspaced beam irradiation points are set, and then, a deflector is controlled so that a charged particle beam scan is performed faster when the charged particle beam irradiates a position on the sample between each of the irradiation points than when the charged particle beam irradiates a position on the sample corresponding to each of the irradiation points (a position on the sample corresponding to each pixel detecting a signal). This allows the effects from a micro-domain electrification occurring within the FOV to be mitigated or controlled.
1. A charged particle beam device for generating an image of a sample, comprising:
a charged particle source for generating a charged particle beam;
a deflector that scans a sample with a charged particle beam emitted from the charged particle source;
a detector that detects a charged particle obtained upon irradiation of the sample with the charged particle beam;
a computer system that processes an output of the detector and controls the deflector; and
a graphical user interface that displays a setting field for setting at least one of a scan speed and an interval of beam irradiation points of the deflector, and also displays a display field for displaying at least one of layout data generated based on design data or an image generated based on design data and an image generated based on an output of the detector,
wherein:
the graphical user interface is configured to allow a plurality of areas to be set on at least one of the displayed layout data and the displayed image, and also to allow each of the plurality of set areas to differ in at least one of the scan speed and the interval of beam irradiation points, and
the computer system controls the deflector so as to execute different beam scan in each of the plurality of set areas based on at least one of the scan speed and the interval of beam irradiation points that has been set on the graphical user interface.
2. The charged particle beam device according to claim 1 , wherein the computer system calculates an image evaluation parameter for each of the plurality of set areas.
3. The charged particle beam device according to claim 2 , wherein the image evaluation parameter is brightness of the area.
4. The charged particle beam device according to claim 3 , wherein the image evaluation parameter is one of a brightness ratio, a brightness difference, and a ratio between the brightness difference and image noise among the plurality of areas.
5. A charged particle beam device for generating an image of a sample, comprising:
a charged particle source for generating a charged particle beam;
a deflector that scans a sample with the charged particle beam emitted from the charged particle source;
a detector that detects a charged particle obtained upon irradiation of the sample with the charged particle beam;
one or more computer systems that controls the deflector and generates an image based on an output of the detector; and
a graphical user interface that displays a parameter space and allows a user to select an operation parameter of the charged particle beam device,
wherein:
the parameter space includes a first dimension and a second dimension, the first dimension including an interval of irradiation points of the charged particle beam, and the second dimension including a scan speed of the charged particle beam by the deflector, and
the graphical user interface is configured to display an inside of the parameter space with the second dimension in an identifiable manner in accordance with a signal amount of the image or a contrast ratio between a plurality of areas within the image when the sample is scanned with the charged particle beam by combining the interval of irradiation points and the scan speed included in the parameter space with the second dimension.
6. The charged particle beam device according to claim 5 , wherein the graphical user interface is configured to display the parameter space with the second dimension using different colors or brightness in accordance with a signal amount of the image or a contrast ratio between a plurality of areas within the image when the sample is scanned with the charged particle beam by combining the interval of irradiation points and the scan speed.
7. The charged particle beam device according to claim 5 , wherein the one or more computer systems is configured to control the deflector so that the sample is scanned with the charged particle beam based on a combination of the interval of irradiation points and the scan speed selected by the graphical user interface.
8. The charged particle beam device according to claim 5 , wherein the one or more computer systems controls the deflector so that scan of the charged particle beam between individual pixels is performed faster than when a position on the sample corresponding to each pixel included in the image is irradiated with the charged particle beam.
9. A charged particle beam device for generating an image of a sample, comprising:
a charged particle source for generating a charged particle beam;
a deflector that scans a sample with the charged particle beam emitted from the charged particle source;
a detector that detects a charged particle obtained upon irradiation of the sample with the charged particle beam;
one or more computer systems that controls the deflector and generates an image based on an output of the detector; and
a graphical user interface that displays a setting field for setting at least one of a scan speed or an interval of beam irradiation points of the deflector, and also displays a display field for displaying at least one of layout data generated based on design data or an image generated based on an output of the detector,
wherein:
the graphical user interface is configured to allow a plurality of areas to be set on at least one of the displayed layout data or the displayed image, and
the one or more computer systems controls the deflector based on at least one of the scan speed or the interval of beam irradiation points that has been set on the graphical user interface, so as to calculate an image evaluation parameter for each of the plurality of set areas.
10. The charged particle beam device according to claim 9 , wherein the image evaluation parameter is brightness of the area.
11. The charged particle beam device according to claim 10 , wherein the image evaluation parameter is one of a brightness ratio, a brightness difference, or a ratio between the brightness difference and image noise among the plurality of areas.
12. The charged particle beam device according to claim 9 , wherein the one or more computer systems controls the deflector so that scan of the charged particle beam between individual pixels is performed faster than when a position on the sample corresponding to each pixel included in the image is irradiated with the charged particle beam.