Charged particle beam device and capturing condition adjusting method in charged particle beam device

1. A charged particle beam device, comprising:

an electron source which generates an electron beam;

an objective lens which is applied with a coil current to converge the electron beam on a sample;

a control unit which controls the coil current to be applied to the objective lens;

a hysteresis characteristic storage unit which stores hysteresis characteristic information of the objective lens;

a history information storage unit which stores history information related to the coil current; and

an estimation unit which estimates a magnetic field generated by the objective lens on the basis of the coil current, the history information, and the hysteresis characteristic information.

2. The charged particle beam device according to claim 1 ,

wherein the history information includes information related to a value of a current at a time when the coil current is switched between increasing and decreasing.

3. The charged particle beam device according to claim 1 ,

wherein the hysteresis characteristic information includes

first curve information indicating a relation between the coil current and a magnetic flux density in a case where the coil current is increased from a first current to a second current after a lens reset process and decreased to the first current again, and

second curve information indicating a relation between the coil current and the magnetic flux density in a case where the coil current is switched between increasing and decreasing before the coil current reaches the first current or the second current after the lens reset process.

4. The charged particle beam device according to claim 3 ,

wherein the second curve information is expressed with a straight line.

5. The charged particle beam device according to claim 1 ,

wherein the hysteresis characteristic information includes a play model which is expressed by a linear sum of a play hysteron.

6. The charged particle beam device according to claim 1 , further comprising:

a focusing lens which converges the electron beam; and

a focusing lens current correction unit which corrects a coil current of the focusing lens according to the magnetic field estimated by the estimation unit.

7. The charged particle beam device according to claim 1 , further comprising:

a scanning unit which scans the electron beam; and

a scanning region correction unit which corrects a region scanned by the scanning unit according to the magnetic field estimated by the estimation unit.

8. The charged particle beam device according to claim 1 , further comprising:

a magnification correction unit which corrects a deflection magnification of a captured image according to the magnetic field estimated by the estimation unit.

9. The charged particle beam device according to claim 1 , further comprising:

a rotation correction unit which corrects an image rotation of a captured image according to the magnetic field estimated by the estimation unit.

10. A capturing condition adjusting method in a charged particle beam device which includes an electron source to generate an electron beam and an objective lens applied with a coil current to converge the electron beam on a sample, the method comprising:

acquiring hysteresis characteristic information of the objective lens;

performing a lens reset operation on the objective lens;

determining the coil current;

acquiring history information related to the coil current; and

estimating a magnetic field generated by the objective lens on the basis of the coil current, the history information, and the hysteresis characteristic information.

11. The method according to claim 10 , further comprising:

correcting a deflection magnification of a captured image according to the estimated magnetic field.

12. The method according to claim 10 , further comprising:

correcting an image rotation of a captured image according to the estimated magnetic field.